Microscopy and Microanalysis: Vol 4, #3, May/june 1998

By: Johnson, Dale E (editor)

Price: $10.00

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Includes 1998 ASU Electron Microscopy Works. Some of the articles: Ion Beam Interface with a 200 keV Transmission electron Microscope for In Situ Micropatterning on Semicondutors; Time-Resolved High-Resolution Transmission Electron Microscopy using a Piezo-Driving Specimen Holder for Atomic-Scale; High Temp in Situ Strianing Experiments; Interphase Boundary Dynamics; Nanoparticle Sintering by Plan-View; Ostwarld Ripening of Germanium Island on Silicon; Melting of Aluminum Particles; Formation of nanocrystalline TiC from TiO2, etc

Title: Microscopy and Microanalysis: Vol 4, #3, May/june 1998

Author Name: Johnson, Dale E (editor)

Categories: Magazines, Science,

Publisher: Springer: 1998

Binding: Magazine

Book Condition: Very Good

Seller ID: 5280

Keywords: Science Microscopy -- Periodicals Microscopy Society Of America Microscopes Microscopy Peter Crozier Peter Crozier Renu Sharma Renu Sharma,