Microscopy and Microanalysis: Vol 4, #3, May/june 1998

By: Johnson, Dale E (editor)

Price: $10.00

Quantity: 1 available

Book Condition: Very Good

Includes 1998 ASU Electron Microscopy Works. Some of the articles: Ion Beam Interface with a 200 keV Transmission electron Microscope for In Situ Micropatterning on Semicondutors; Time-Resolved High-Resolution Transmission Electron Microscopy using a Piezo-Driving Specimen Holder for Atomic-Scale; High Temp in Situ Strianing Experiments; Interphase Boundary Dynamics; Nanoparticle Sintering by Plan-View; Ostwarld Ripening of Germanium Island on Silicon; Melting of Aluminum Particles; Formation of nanocrystalline TiC from TiO2, etc

Title: Microscopy and Microanalysis: Vol 4, #3, May/june 1998

Author Name: Johnson, Dale E (editor)

Categories: Science, Magazines,

Publisher: Springer: 1998

Book Condition: Very Good

Seller ID: 5280

Keywords: Microscopy -- Periodicals Microscopy Society Of America Peter Crozier Peter Crozier Renu Sharma Renu Sharma Renu Sharma Miyoko Tanaka Miyoko Tanaka,